POLARIMETRY

We use ellipsometry as an optical polarimetric technique to characterize a wide range of materials and structures:

• Amorphous and anisotropic thin films and multilayers
• Porfiryn J-aggregates in solid state or in solution
• Single nanoparticles and nanoparticles arrangements

We dispose of three ellipsometer apparatus:

UV-visible two-modulator ellipsometer

IR Fourier transform phase modulated ellipsometer

Laser scattering phase-modulated ellipsometer