The objectives of the Polarimetry research line focuses on the development of new instruments and innovative applications for the use of polarimetry in the characterization of thin films, anisotropic systems and nanoscopic matter.
Our present research involves three equipments:
A UV-VIS two-modulator generalized ellipsometer. This equipment supplies the full Mueller matrix of the sample under study in the spectral range from 200 to 800 nm, either in transmission or in reflection. This ellipsometer is particularly useful in crystal optics, optical activity and enantiomorphism, and in the study of anisotropic materials in general.
A phase-modulated interferometric micropolarimeter working at 532 nm, intended to detect and characterize single nanopartícules in a microfluidic channel
A Fourier Transform Infrared phase-modulated ellipsometer covering the spectroscopic range between 3 and 20 microns and devoted to measure optical activity of non conventional samples.use ellipsometry as an optical polarimetric technique to characterize a wide range of materials and structuresngle nanoparticles and nanoparticles arrangements