At the GROF we have developed software tools for the optical characterization of thin film materials and multilayered stacks. We have implemented our previous know-how in the algorithms for optical data reduction from ellipsometric and/or spectrophotometric measurements.

Our experience is the result of our work in various scientific and industrial projects. This guarantees an state-of-the-art knowledge in the field of thin film applications, leading to suitable algorithms for the specific needs of the optical characterization problems.

Go to the NKDGEn /NKDMATl / NKDStack page:   http://www.ub.edu/optmat

This research is carried out in collaboration with the Physical Optics and Laser Beams Group of the Universidad Complutense de Madrid.. The objective is the parametrization of the spatial and vectorial structure of light beams. General solutions of Maxwell equations in terms of the plane-wave spectrum of the electromagnetic field are analyzed.  The task of our group is centered on the numerical verification of the theoretical results.