Optical Characterization Group

Universitat de Barcelona


New

At the Optics Laboratory of the Applied Physics and Optics Department of the University of Barcelona, we have developed software tools for the optical characterization of thin film materials and multilayer stacks. We have implemented our previous know-how in the algorithms for optical data reduction from ellipsometric and/or spectrophotometric measurements.

Our experience is the result of our work in various scientific and industrial projects. This guarantees an up-to-date knowledge in the field of thin film applications, leading to adequate algorithms for the specific needs of the optical characterization problems.