Optical characterization of HfO2 by spectroscopic ellipsometry: dispersion models and direct data inversion,
Thin Solid Films, in press, 2008
J. Sancho-Parramon, M. Modreanu, S. Bosch, and M. Stchakovsky

Optical characterization of ns-SiN:H in the infrared by spectroscopic ellipsometry,
Applied Surface Science, Volume 253, 2006, pages 65-69
J. Sancho-Parramon, S. Bosch, and A. Canillas

Modeling of optical properties of silver-doped nanocomposite glasses modified by electric-field-assisted dissolution nanoparticles,
Applied Optics, Volume 45, No. 35, December 2006, pages 8874-8881
J. Sancho-Parramon, A. Abdolvand, A. Podlipensky, G. Seifert, H. Graener, F. Syrowatka

Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization,
Applied Optics, Volume 42, Issue 7, March 2003, pages 1325-1329
J. Sancho-Parramon, J. Ferré-Borrull, S. Bosch, and M. C. Ferrara

A general-purpose software for optical characterization of thin films: specific features for microelectronic applications,
Solid-State Electronics, Volume 45, Issue 5, 2001, Pages 703-709,
S. Bosch, J. Ferré-Borrull and J. Sancho-Parramon.

Effective dielectric function of mixtures of three or more materials: a numerical procedure for computations,
Surface Science, Volume 453, Issues 1-3, 2000, Pages 9-17
Salvador Bosch, Josep Ferré-Borrull, Norbert Leinfellner and Adolf Canillas

Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region,
Proc. SPIE Vol. 4094, p. 15-22, Optical and Infrared Thin Films, Michael L. Fulton; Ed. , 2000
S. Bosch, N. Leinfellner, E. Quesnel, A. Duparre, J. Ferre-Borrull, S. Guenster, D. Ristau,

General inversion method for single-wavelength ellipsometry of samples with an arbitrary number of layers,
JOSA A, Volume 12, Issue 6, June 1995, page 1375
S. Bosch, F. Monzonis