Gavrilenko, M., Batanova, V. G., Llovet, X., Krasheninnikov, S., Koshlyakova, A. N., & Sobolev, A. V. (2023): Secondary fluorescence effect quantification of EPMA analyses of olivine grains embedded in basaltic glass. Chem. Geol. 621.

Pinard, P. T., Heikinheimo, E., Llovet, X. & Richter, S. (2014): Towards reliable quantification of steel alloys at low voltage. Microsc. Microanal. 20, 700–701

Gopon, P., Fournelle, J., Sobol, P., Spicuzza, M., Pinard, P., Richter, S., Llovet, X. & Valley, J. W. (2014): Soft X-Ray EPMA analyses of extremely reduced phases from apollo 16 regolith: Problems and solutions for sub-micron analysis. Microsc. Microanal. 20, 698–699.

Llovet, X., Pinard, P. T. & Salvat, F. (2014): Application of monte carlo calculations to improve quantitative electron probe microanalysis. Microsc. Microanal. 20, 708–709.

Llovet, X., Powell, C. J., Salvat, F. & Jablonski, A. (2014): Cross Sections for Inner-Shell Ionization by Electron Impact. J. Phys. Chem. Ref. Data 43, 013102.

Merlet, C., Moy, A., Llovet, X. & Dugne, O. (2014): Measurements of absolute Mα x-ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact. Surf. Interface Anal. 46, 1170–1173.

Moy, A., Merlet, C., Llovet, X. & Dugne, O. (2014): M-subshell ionization cross sections of U by electron impact. J. Phys. B At. Mol. Opt. Phys. 47, 055202

Moy, A., Merlet, C., Llovet, X. & Dugne, O. (2014): Optimization of actinide quantification by electron probe microanalysis. IEEE Trans. Nucl. Sci. 61, 1977–1983

Rinaldi, R. & Llovet, X. (2015): Electron Probe Microanalysis: A Review of the Past, Present, and Future. Microsc. Microanal. 21, 1053–1069.

Llovet, X., Pinard, P. T., Heikinheimo, E., Louhenkilpi, S. & Richter, S. (2016): Electron probe microanalysis of Ni Silicides Using Ni-L X-Ray lines. Microsc. Microanal. 22, 1233–1243.