Title: A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

Authors: Yedra, L.; Kumar, C.N.S. .; Pshenova, A.; Lentzen, E.; Philipp, P.; Wirtz, T.; Eswara, S.
Journal: Journal of Analytical Atomic Spectrometry
Vol: 36
Number: 1
Start page: 56
Last page: 63
DOI: doi
Institutional repositories:
Year: 2021
Key: Article