Conferenciant: Prof. Dr. Gianluigi Botton, Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Canada
Resum: Electron energy loss spectroscopy (EELS) is an invaluable technique to study the detailed structure and the chemical state of materials at unprecedented spatial resolution. This technique, combined with aberration-corrected microscopes, is used to characterize nanoscale materials used in a myriad of applications from energy storage and conversion, to solid-state devices and biomaterials interfaces.
In this presentation, recent developments in EELS to probe the changes in bonding and coordination of atoms will be described. It will also be shown that, with aberration-corrected and atomic resolved EELS, it is possible to determine ordering of cations in oxides and changes in bonding at interfaces. It will be highlighted how atomic resolved experiments with EELS near edge fine structures can be used to systematically study the local valence in high-T superconductors and even prove the local electronic structure of energy storage materials.
Finally, it will also be shown how EELS can provide exquisite details on the plasmonic response of simple and very complex metallic nanostructures.
