Chert characterization using reflectance spectroscopy. Ryan Parish

publicat: 28 oct. 2015  |  
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  • SESSION 6 - Characterising lithic sources
    Chert characterization using reflectance spectroscopy

    The study presents research demonstrating the potential application of reflectance spectroscopy data in chert provenance research. Reflectance spectral data gathered in the visible, near- and middle- infrared regions records the interactions of both the atomic and molecular configuration of chert with portions of electromagnetic radiation. A large chert sample database consisting of over 3,000 samples from 100 plus deposits in the Midwestern and Southeastern United States highlights the application of reflectance spectroscopy to differentiate chert by formation, by outcrop or deposit and by intra-deposit. The non-destructive application of outer surface analysis is tested using controlled experiments. Other potential variables affecting accurate provenance information including, thermal alteration, sample size and thickness, intra-sample or intra-artifact variation, instrument noise, sample geometry and multivariate statistical analysis are considered.

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